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OptimalTest’s new generation of Test Management Solutions (TMS) gives you unprecedented improvements in Yield, Test Time Reduction, Reliability, Quality and Productivity based on our:

Innovative advanced adaptive testing methodology
Patented reference die technology
Data Feed Forward/Data Feed Backward capability
Centralized, engineering-oriented database designed for rapid data retrieval
Unparalleled data integrity and actionable data throughout the IC lifecycle
Unique open test-rule generator
Open IT infrastructure and seamless connectivity
Real-time automation and control

High performance test management at low cost of test allows you to adapt and correct your test processes in real time and continuously improve and evolve products, processes, and operations to compete more effectively.

Site Map

At Semicon West, attend our TechSITE presentation, "Test Operations Optimization and Adaptive Test Proliferation Across Enterprises," Wednesday, July 14, 11:30 a.m., North Hall.

OptimalTest Enters Deal with STMicroelectronics To Provide Advanced Adaptive Test Solutions. click here for more.

Lite Applications Engines Speed Delivery of Advanced Adaptive Test Solutions click here for Final Test Report article.

Click here to see Advanced Adaptive Test: TTR for the FLEX IGXL Platform, presented at TUG 2010.

See what Qualcomm says about industry-leading software providers and Cost of Test Operations at www.semiconsingapore.org, under Programmes & Events, Speaker Presentation Slides, Product Test Engineering.

What test era are YOU in? Click here for our new OptimalEnterprise brochure. It’s time for test to catch up with reality!

Advanced Adaptive Test – White paper
Available now Click here to get a copy

Times like these present the opportunity
to take stock of how you can

to emerge as a stronger, more efficient
player