Until OptimalTest combined adaptive testing techniques with … Modern database technology Real-time software tools Seamless networking

OT Advanced Adaptive Testing Brochure >

… many viewed adaptive testing only as a way to reduce test time. But with OptimalTest’s comprehensive, innovative test management solutions, adaptive testing also:

• Significantly improves yield learning, yield reclamation, reliability and quality Achieves these improvements in real time so that data becomes immediately actionable so products and operations can evolve.
• Processes more data with more automation and higher data integrity while enhancing its value as useful, accessible information.

Modern testing has progressed beyond separating good chips from bad. The multiple disciplines of design, fab, test, quality and reliability all put unique demands on the effectiveness of the test program. In the past, these demands were prohibited by cost and the lack of real-time data to differentiate one chip from another. Therefore, traditional testing applied the same, compromised test program to all chips. However OptimalTest’s application of adaptive testing encompasses enterprise-wide networks, modern databases and the advantages of real-time results -- as well as two innovative methodologies for establishing reference dies and flexible rule sets – to unleash the power of leveraging data across the enterprise.




OptimalTest’s innovations in adaptive testing techniques give you the latest generation of test management tools for significant, continual improvements in

• Yield learning for better design and manufacturing processes across the entire IC lifecycle
• Yield reclamation, test time reduction, reliability, quality
• Lowering test costs and increasing test capacity

OptimalTest’s implementation of “intelligent” adaptive testing goes beyond the common view of adaptive test as simply skipping tests to reduce test time. Instead, OptimalTest

• Adds tests to targeted devices to give you greater
  - yield learning and yield, up to 5% at wafer sort and final test
  - reliability and quality on ALL devices while reducing test times on reference dies by up to 30%
• Focuses on data integrity and data accessibility
• Leverages recent advances in data management and analysis tools
• Provides a new standard of process control

The innovative technology that enables OptimalTest’s advanced adaptive testing includes modern database technology combined with adaptive testing. Among its benefits:

• Providing data you can act on
• The ability to establish reference dies/units
• A consolidated, open algorithm (rule) engine

OptimalTest’s unique, updated approach for intelligent adaptive testing requires that control and discipline be maintained via two critical means -- reference dies/units and test rules -- with patented technology for establishing reference dies/units for all wafers, lots and products. This capability allows you to immediately create yield and reliability baselines, giving you essential information for making further decisions regarding yield, test time reduction, reliability and quality while simultaneously realizing reduced costs and other business benefits. Decisions about test time reduction and reliability can be made in real time and decisions from yield learning, offline.