OptimalTest has developed several new capabilities to bring real-time learning, monitoring, and control to test management for the first time:

• Real-time generation and adaptation of algorithms
• Real-time execution of rule-sets based on rule adaptations
• Real-time external test program control, adaptation and execution based on flexible algorithms for any product at any parallelism level for almost all ATE
• Real-time access to data from across the semiconductor enterprise, across the IC life cycle (design, fabrication, wafer sort, assembly, final test)

Thanks to our advanced adaptive testing and development of real-time automation capabilities to integrate ATE functions, we can provide better solutions to your IC production and test operation, including:

• Maximized yields through real-time bins, parametric & channels monitoring
• Yield learning through real time reference dies/units patented methodology

• Collection of and access to real-time, centralized test results at all levels (bin, parametric, etc.)
• Real-time execution of TTR algorithms based on advanced adaptive testing
• Real-time quality monitors

• Collection of and access to real-time, centralized test results
• Real-time definition of reliability rules (PAT, S-PAT, D-PAT for wafer sort and final test)
• Real-time execution of many additional reliability algorithms based on advanced adaptive testing

• Real-time control of all ATE – testers, probers, and handlers – independent of devices and processes and supporting all levels of parallelism
• Real-time control and adaptation of test programs
• Real-time execution of advanced adaptive testing algorithms for OptimalTest’s yield, TTR and outlier detection solutions

• Real-time control and monitoring of the entire test fleet
• Real-time execution of advanced adaptive testing algorithms for OptimalTest’s yield, TTR and outlier detection solutions
• Real-time indicators for performance issues