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OptimalTest Articles
"Operational Visibility Is Key"
By Dan Glotter, Design & Test Issues, Final Test Report, Feb 2009 (page 11)
"Adaptive
Test Delivers More Than TTR"
by John Bearden, Final Test Report, May 2008.
"Yield Loss:
It's Not All Process Defects"
by John Bearden, Semiconductor International Online, November 26, 2007.
"Optimizing
Product Cost Through Modern Test Management"
by John Bearden, Solid State Technology, May 2007.
OptimalTest In the News
"Teradyne & OptimalTest agree to deal"
ATE Forum, May 18th 2009
"Software’s role in test"
Test & Measurement World, January 2009
"Debbora Ahlgren
has joined OptimalTest as its VP Sales & Marketing"
Final Test Report, January 2009 (page3)
“OptimalTest signs agreement with STATS ChipPAC”
Final Test Report, November 2008 (page12)
“OptimalTest
signs agreement with STATS ChipPAC”
Final Test Report, October 27, 2008 (page 2)
"Ken Levy Joins
OptimalTest as Chairman of Board"
Final Test Report, April 2008.
"ITC 2008: OptimalTest to provide test-management software to STATS ChipPAC"
Test & Measurement World, 11/3/2008 9:18:00 AM
"OptimalTest Demonstrates Report and Outlier Management Tools"
Test & Measurement World Online, October 30, 2007.
"Focus On: OptimalTest"
Final Test Report, November, 2006.
"Start-up Promises Better Yields Through Test Management"
Electronic Engineering Times, November 27, 2006.
"OptimalTest Introduces Test Management Software"
Test & Measurement World Online, October 25, 2006.
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Recent Press Releases
OptimalTest Showcases Test Management & Optimization Software Solutions
Targeted to the Global Fabless Value Chain at GSA Emerging Opportunities Expo
October, 2009
OptimalTest Participates in Korean Test Conference as Industry
June, 2009
OptimalTest Announces Country Manager for Korea
June, 2009
Teradyne & OptimalTest Agree to Jointly Market Test Operations Optimization Solutions
May, 2009
Optimaltest’s global test operations software
WINS 2009 ‘BEST IN TEST’ AWARD
April, 2009
OptimalTest Press Release; Company Expands Presence in Asia
March, 2009
"Debbora Ahlgren has joined the company as Vice President, Sales & Marketing"
January, 2009
"OptimalTest to Provide Test Management Solution to STATS ChipPAC" October, 2008
"Kenneth Levy,
International Semiconductor Industry Visionary, Joins OptimalTest as Chairman of
the Board" March, 2008.
"OptimalTest Secures
$16 Million in Second Round of Funding" December, 2007.
"Major European Semiconductor Company Adopts OptimalTest's Test Management Software
for Global Deployment" October, 2007.
"OptimalTest Demonstrates
Latest Test Management Capabilities at ITC … is also Diamond-level Corporate Supporter"
October, 2007.
Recent Presentations
John Bearden presented his paper, "Technology Innovations Enable Vastly Improved
Test Quality," at the European Manufacturing Test Conference (EMTC) at Semicon Europa
in October 2008.
Dan Glotter made a presentation about advanced adaptive testing to JEITA in Tokyo
in July 2008.
John Bearden spoke about advanced adaptive testing and its role in yield management
at Semicon West in July 2008.
Newsletters
OptimalTest eNEWS
Apr 2009
OptimalTest eNEWS
Feb 2009
OptimalTest eNEWS
Jan 2009
OptimalTest eNEWS
Dec 2008
OptimalTest eNEWS Oct
2008 - Solutions & ITC Plans
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