EXCELLING IN POST-PRODUCTION TEST
Through execution of advanced off-line rule sets, OT-POST reevaluates all testing results and dispositions them accordingly, to better control the quality and health of your testing operation. OT-Post performs cross quality evaluations of the entire testing fleet and all device test time and yield, offering extreme data integrity. OT-Post
augments product reliability through PAT and other advanced outlier techniques. OT-Post offers enhanced visibility for test results and fleet health, and insight into the entire testing process.
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INDUSTRY CHALLENGES:
- Homegrown post-production testing solutions which are often unvalidated, uncontrolled,
and in some cases with conflicting scripts.
- Limited post-testing rules, if they exist, cover only basic PAT and health control.
And, many post-production operations are undocumented and hard-coded into system
equipment - lacking the flexibility and scalability demanded by today's testing
standards.
- Need for new tools that add comprehensive data integrity and provide a rich, structured
rule-set language.
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OT Post BENEFITS
ENHANCED RELIABILITY
OT-Post enhances device reliability through a rich array of reliability augmentation
rules, including PAT, advanced outlier detection, and other sophisticated reliability
algorithms. These can be validated to catch reliability fallout at the current socket
rather than the next socket, decreasing next socket capacity demands like burn-in
capacity, and increasing overall product reliability.
BETTER END-MARKET CLASSIFICATION
OT-Post helps better categorize and cherry-pick your devices for the right marketing
niches or create the right combination of devices within a Multi-Chip-Package (MCP)
device for targeted markets.
CROSS-QUALITY HEALTH CONTROL
OT-Post offers improved health control through rich and unique SPC comparison of:
Processes
OT-Post detects non-optimized processes through lithography, defects, e-test parameters
and other unique SPC criteria for highest yields and best process operation windows.
Devices
OT-Post detects non-optimized device testing processes and related characteristics,
helping align all devices to a baseline, and controlling yield, retest/resort rates,
and real-time rules.
Test Fleet
OT-Post detects outlier test equipment through rich SPC rules, seeking out equipment
outliers, trends, marginalities and freezes – and baselining your fleet at highest
standards.
Test Process
OT-Post detects critical parameters like correlation/standards pass rate, run rate
and performance. OT-Post also detects die gain and binswitching control resulting
from retest/resort – across all SPC rule types for best process optimization.
IMPROVED GATEKEEPING
OT-Post detects test data integrity issues and human errors from a yield and shipping
perspective, including verification that material was processed with intended criteria
(test program, post processing rule, disposition rules, etc).
DYNAMIC DISPOSITION
Rules triggered by bins or parameters that are normally executed in real-time are
executed in off-line mode by OT-Post for analysis and material disposition purposes.
The actions may invoke a variety of disposition criteria such as - resort/retest,
hold, scrap, tag for burn-in, inking, etc.