OT-REPORTS – ADVANCED, COMPREHENSIVE REPORTING FROM THE TEST PERSPECTIVE
Developed by experienced semiconductor test engineers specifically for test experts,
OT-Reports is unique for its sophisticated and comprehensive automated report coverage
of device testing, in addition to its ability to recommend specific corrective action.
OT-Reports supports excellence and control at every phase of test – engineering,
analysis, operations, manufacturing, management – with specific capabilities that
address IC industry companies’ concerns across the spectrum of IDMs, Foundries,
Fabless, and Subcontractors. Capable of extracting real-time as well as off-line
test process data, OT-Reports contains hundreds of predefined reports organized
in a usage per user-type matrix to simplify and expedite end-user tasks for operations,
engineering, management and customers. In addition to very high report-generation
performance, OT-Reports also provides flexibility, with query definition capabilities
in addition to predefined reports and the ability to create new logs automatically,
whether you have 100 or 1,000 products. It includes a “report builder” feature so
that customers have a development-like environment to build, design and configure
their own reports. OT-Reports leverages your organization's knowledge and turns
it into a real asset by being accessible and actionable .
OT-REPORTS FEATURES AND BENEFITS:
END-to-END EXPERT SYSTEM – OT-Reports contains hundreds
of pre-defined reports, each supporting specific tasks in the IC product/process
lifecycle through real-time execution and post production. The system goes beyond
data mining, and can indicate abnormal events, including automatically analyzing
root causes for failures that affect operational effectiveness, and more importantly
recommend immediate corrective action.
ANALYSIS REPORTING – Featuring a unique database
designed to support very fast data extraction in multiple passes, OT-Reports provides
an extensive set of analysis reports that allow product and test engineers to expand
their scope of expertise. Using OT-Reports as an advanced toolbox, test engineers
have access to new tools that leverage their skills and overall contributions, as
well as access to an easy to use database encompassing years of experience and best
knowledge practices.
DYNAMIC REPORTING – Maximizing flexibility in reorganizing
data, OT-Reports allows dynamic reporting – that is, the user can set report filters
and layouts to customize reports. In addition the user can save the settings of
customized reports with or without the report query criteria for reuse or sharing,
to extract specific data. This feature also provides a “drill down” capability to
zoom in on raw data for data analysis and troubleshooting.
EXPORT/IMPORT – from each report can be exported
for off-line needs. OT-Reports supports Excel, PDF, Word Documents, HTML and other
common formats. The export mechanism includes both data and query definition for
easy off-line analysis.
REMOTE ACCESS – Recognizing the business needs of
the various companies (IDMs, Fabless, Foundries, Subcontractors) working together
in today’s semiconductor industry, OT-Reports supports remote data access over a
secured network (VPN) via a Windows™-standard web browser to accommodate different
customers in different organizations or within the same organization.
SECURED DATA MANAGEMENT – Recognizing the sensitivity
and importance of test data, OT-Reports’ parent module, OT-MGR, manages all data
access via controlled access using all-level security – that is, at the database
level and at the client application level using Windows™ authentication. Access
to each report is managed, controlled and monitored, with an access “signature”
recorded in the database.
ALL DATA FORMATS AND SOURCES – OT-Reports generates
reports based on data extracted from the OT-TMS database. Using OT-Server, semi-standard
files such as STDF and ATDF get parsed and loaded. Custom formats can also be supported
through simple, quick integration.
AUTOMATIC HEALTH CHECK FOR DATA INTEGRITY – During
all data manipulation starting with data extraction and as a standard feature across
all product modules, OT-TMS monitors for missing, incorrect or corrupted data. OT-Reports
allows users to identify lots and wafers that have data integrity issues so they
can be addressed .