Using innovative advanced adaptive testing techniques and a unique open, flexible algorithmic engine, OptimalTest solutions can give you near zero defects. ubstantially augmenting device reliability through a variety of PAT and other techniques, our solutions significantly reduce device DPPM and lower your burn-in capacity needs.

When the goal is increased reliability, our advanced adaptive testing techniques incorporating the use of reference die give you the opportunity to add tests only to the reference dies with no impact on other devices. Using reference die, you can achieve testing excellence and unprecedented improvements in quality and reliability while enhancing your yield baseline. This is especially critical for industries such as the automotive industry, where defects have enormous negative impact.

Designed for closed-loop learning locally or throughout a global enterprise, our solution encompasses outlier analysis and rules simulation and introduces outlier rule sets to production. In addition, via our structured rule set generator, a rich array of rules augment reliability and ensure high levels of quality, even as test time is reduced.

OptimalTest understands that your product’s reliability is important to your ability to compete.