Based on innovative advanced adaptive testing techniques, OptimalTest solutions increase your yields by reclaiming devices wrongly labeled “bad” in both real time and offline. Using OptimalTest’s solutions, customers have realized yield increases of up to 5% at wafer sort and final test.

OptimalTest’s implementation of “intelligent” adaptive testing through the use of reference dies/units lets you preserve your yield base line. Extensive testing on reference dies creates an ongoing base line for yield learning and device models without sacrificing TTR. Moreover, for best yields and yield learning, the reference dies can be coupled with actionable data from other fabrication steps such as lithography exposures, defects & particles sampling, in-line and end-of-line E-test, wafer sort, burn in and final test enabling yield learning across the entire IC lifecycle.

Because of our innovations in adaptive testing, you can also add measurements for yield, reliability or test in specific reference die locations to enhance yield learning.

OptimalTest gives you invaluable yield learning and better yields to make you more competitive.