Using OptimalTest’s solutions, customer test times have been reduced by as much as 30%. Reductions of this magnitude are possible without sacrificing yield, quality or reliability. In fact, OptimalTest’s unique approach to test time reduction (TTR) enables you to add tests for greater yield, quality and reliability while reducing test times.

OptimalTest has combined traditional test time reduction techniques with its innovative implementation of adaptive testing –“intelligent” adaptive testing in an entirely automated process throughout the IC lifecycle. Designed for closed-loop learning locally or throughout a global enterprise, our solution encompasses TTR analysis and rules simulation and introduces structured TTR rule sets to production.

Advanced adaptive testing goes beyond the traditional approach of reducing test times by simply skipping tests to give you unparalleled value. OptimalTest’s innovative adaptive testing technologies use reference dies/units, customized algorithms, and a centralized, comprehensive database for control, discipline and flexibility so that you can strategically add tests as your business demands.

OptimalTest gives you the ultimate tool for TTR and for gaining a competitive edge.