OptimalTest’s rich variety of outlier detection methods goes beyond separating good
devices from bad to address an overriding customer concern: Ensuring the highest
level of end-product quality by approximating zero defects. We accomplish this via
five key capabilities: Analysis, definition, real-time detection, off-line detection,
monitoring. Going beyond traditional outlier tools, our implementation of outlier
detection encompasses ensuring data integrity, monitoring the health of equipment,
processes and operations, and other extraordinary quality checks. Our expert-system-based
solution is integrated across the test process from wafer sort to final test, and
addresses outlier behavior caused by faults in the device, equipment or material
at any point in the IC lifecycle process.
Key Features & Benefits:
-
Powered by advanced adaptive testing methodology
- Rich algorithms, including PAT, DPAT, ULPY, as well as many others
- for wafer sort in real time and off line
- for final test in real time
- Automated closed-loop process for continuous improvement
- Flexible to adapt your proprietary algorithms
- Outsourced off-line outlier detection solutions
By delivering better data integrity and greatly improved reliability and quality,
along with preserving reduced test time and yields, we give you an unparalleled
tool for outlier detection so you can adapt … evolve … win.
For more information about this solution click here >
Until now, outlier detection has been limited by the scope of existing tools. But
today, OptimalTest has redefined “outlier detection” to encompass ensuring data
integrity, monitoring the health of equipment, processes and operations, and other
extraordinary quality checks.
OptimalTest’s expert-system-based Outlier Detection solution, using advanced adaptive
testing techniques, is integrated across the test cycle from wafer sort to final
test – real time and off line – and addresses outlier behavior caused at any point
in the IC lifecycle process by faults in the device, equipment or material.
Using adaptive testing principles, our Outlier Detection tools not only identify
outliers but also monitor, analyze and locate defects without “over killing” good
parts. OptimalTest’s universal testing scenario language creates a rich array of
real-time and off-line reliability rules, using various types of Parts Average Testing
(PAT) including those specified by the Automotive Electronics Council. These rules
are designed in predefined templates that are easily customizable. Because of OptimalTest’s
unique integrated architecture, centralized data from various sources is available
to each rule.
Our Outlier Detection solution provides five key capabilities:
- Outlier Analysis
- Outlier Definition
- Real-time Outlier Detection
- Off-line Outlier Detection
- Outlier Monitoring
Additional Features:
- Powered by advanced adaptive testing methodology
- Rich algorithms, including PAT, DPAT, NNR, GDBN, ULPY as well as many
others
- For wafer sort in real time and off line
- For final test in real time
- Unique SPC techniques for devices as well as for the test fleet, process,
and operations
- Automatic health checks & monitoring for missing, incorrect or corrupted
data
- Trend, freeze and marginality detection
- Dynamic stressing (voltage, duration, flows)
- Early warning of degrading trends before catastrophic fails
- Flags for lots and wafers with data integrity issues
- Automated closed-loop process for continuous improvement
- Flexible to adapt your proprietary algorithms
- Outsourced off-line outlier detection solutions
- Easy integration and adaptation with existing solutions or other OptimalTest
Solutions
Additional Benefits:
- Improved cross-quality health control
- Better data integrity
- High product reliability & quality
- Preservation of reduced test time, yields
- Actionable data for continuous improvement, more effective decision
making
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