In a class by itself, OptimalTest’s station controller offers real-time control
for all testers, probers, handlers, and test programs, making it process- and device-independent
and supporting all levels of parallelism. Free of hard-coded algorithms, it executes
in real time and brings flexibility and universality to your test function.
Our station controller can function as a completely standalone solution for achieving
greater efficiency, yield reclamation and quality or can be the execution arm for
our other solutions – for example, executing the real-time functions of our Yield
Learning, TTR and Outlier Detection solutions.
Key Features & Benefits:
- For all testers, probers, handlers
- For all types of test programs
- For all devices and processes
- For all levels of device parallelism
- Comprehensive, real-time SPC capabilities
- Execution arm of advanced algorithms (TTR, PAT, yield, etc.)
- External, with no impact on tester performance
- Seamless Fail-over Recovery
This solution gives you flexible, universal, real-time test control as a critical
component to reaching new levels of productivity and test management capabilities
… adapt … evolve … win.
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Our
Station Controller solution can control and
adapt test programs in real time, unconstrained by
hard-coded, inflexible algorithms. Our test-floor
solution helps deliver flexibility and universality
to your test function and supports efficiency and
productivity in your test operation, including freeing
up valuable in-house programming resources so
you can focus on core competencies.
Part of our comprehensive solution set, OptimalTest’s
Station Controller solution is a critical component
in growing your test management capabilities.
It can function as a completely standalone solution
to achiever greater efficiency, yield reclamation
and quality or it can function as the execution arm
of many of our other solutions. For example, it
can execute the real-time functions of our Yield
Learning & Reclamation, TTR and Outlier Detection
solutions, giving you a powerful tool for increased
competitiveness. If you decide to expand into other
OptimalTest test management solutions, it will allow
you to implement those modules’ advanced adaptive
testing to leverage Data Feed Forward/Data Feed
Backward and give you direct access to centralized
databases.
Among the many algorithms that can run
simultaneously on our station controller are two
practical clean-on-demand algorithms:
Reactive – Bin & soft bin monitoring to trigger
probe cleaning prior to taking a yield hit while
minimizing on-line retest and eliminating off-line
retest (re-sort);
Proactive - before any hit on yield happens,
(activated clean upon parametric degradation) and
reactive clean on demand (bin, soft bin, parametric
& channel monitoring for monitoring consecutive
bin failures (CBL))
Additional Features:
- Real-time testing module control – tester/prober/handler
- Universal controller for all ATE, all products, all levels of parallelism
- For Wafer-Sort and Final-Test
- Standard multi-lingual GUI
- Comprehensive SPC capabilities
- Enables real-time execution of advanced adaptive testing algorithms
(yield, TTR, outlier)
- Remote access
- Enables control room mode
- Field-proven with unique fail-over recovery mechanism
- Easy integration and adaptation with your existing solutions and with
other OptimalTest test management solutions
Additional Benefits:
- Saves time and money for training and other overhead costs
- Eliminates performance restrictions of proprietary station controllers
- Integrates functionality of other OptimalTest solutions to maximize
yield, reliability, quality and lower test costs
- Easy, rapid engineering locally or remotely
- Centralized control locally or remotely