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TEST TIME REDUCTION
OT-TMS reduces test times significantly by combining traditional testing reduction techniques with the advanced methodologies of adaptive testing, in an entirely automated process, throughout the device lifecycle.
     
HIGHEST YIELD
OT-TMS increases your yields – a key performance indicator -- by reclaiming devices wrongly labeled "bad" in both real-time and off-line to allow unprecedented data integrity across the entire testing chain.
     
MAXIMUM UTILIZATION
OT-TMS helps you achieve greater utilization and enhanced throughput via real-time control and off-line monitors while pinpointing inefficiencies and enabling prompt responses.
     
BEST RELIABILITY
OT-TMS augments product reliability through a unique array of rules ranging from PAT and advanced outlier detection techniques to patented reliability solutions of dynamic stressing. All significantly reduce device DPPM and lower your burn-in capacity needs.
     
TOP QUALITY
OT-TMS can double your testing process quality through a rich and unique selection of Statistical Process Control algorithms and methodologies, applied both in real-time and off-line. What’s more, these rule families are integrated with OptimalTest’s advanced simulation capabilities for maximizing results and ROI.
     
 
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