OptimalTest’s Test Time Reduction (TTR) solution -- based on adaptive testing and
in real time -- is accomplished through an entirely automated process throughout
the device lifecycle enabled by our Data Feed Forward/Backward methodology and our
patented methodology to flag reference dies and geographies. This very robust TTR
solution results in higher quality data logging, with virtually no impact on throughput.
Key Features & Benefits:
- Analysis and simulation to identify and set values for TTR candidates
- Maintains high quality while maximizing TTR
- Rich set of algorithms
- for wafer sort in real time and off line
- for final test in real time
- Automated closed-loop process for continuous improvement
With up to 30% reductions in test time, continuous improvement in test costs and
quality, and maximized ROI, you can realize unprecedented benefits in your TTR efforts
by using our solution to adapt … evolve … win.
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This “adaptive real-time TTR” is accomplished through an entirely automated process
throughout the device lifecycle, enabled by OptimalTest’s Data Feed Forward/Backward
methodology and the ability to flag reference dies and geographies. This very robust
TTR solution results in higher quality data logging, with virtually no impact on
throughput.
As part of OptimalTest’s special approach to TTR, we enable you to establish yield
baselines and sustain yield learning through our patent-pending reference die techniques
for quality control at wafer sort and final test. We provide a number of built-in
quality monitors to maximize benefits without compromising process quality.
Our wide range of applications and algorithms for reducing test program execution
time and for providing “full-loop” support include:
- Analysis reports to identify potential candidates for TTR
- Simulation to evaluate the TTR value
- Quality monitors to ensure no quality issues are triggered by TTR
efforts
- Algorithms configured for the desired TTR rules to be executed
- Real-time execution
- Data collection of real-time test results at all levels (that is,
bin, parametric, etc.)
- Real-time and off-line quality monitors ensuring no quality issues
during execution
- Classic, off-line TTR analysis
Additional Features:
- Analysis and simulation to identify and set values for TTR candidates
- Maintains high quality while maximizing TTR
- Rich set of algorithms
- For wafer sort in real time and off line
- For final test in real time and off line
- Automated closed-loop process for continuous improvement
- Ability to simulate potential benefits via “What if” scenarios
- Automatic recommendations for new TTR options
- Easy integration and adaptation with existing solutions or other OptimalTest
Solutions
Additional Benefits:
- Test time reduction up to 30%
- Significant test cost savings
- Continuous improvement and maximized ROI
- Rapid implementation (from configuration of rules to release to production)
- Minimum manpower required to cover hundreds of products
- TTR process quality assurance
- Actionable data for continuous improvement, more effective decision
making