OptimalTest has created an operations solution for wafer sort and final test that
maximizes yield up to 5% through recovery of devices wrongly labeled “bad.” It also
increases efficiency and productivity up to 20% by re-optimizing re-test and set-up,
and managing probe cards and load boards. Providing total test floor management
including real-time control of all ATE, fleet control and monitoring, it compares
operational performance metrics for all testers running the same product to better
identify yield and other issues. As part of our entire suite of solutions, it can
also execute adaptive testing and advanced SPC algorithms through pre-defined templates
that automate the entire testing process and shorten the learning curve for faster
decision making.
Thorough operational control with no sacrifice of flexibility or performance, our
solution for test floor operations contributes to your ability to compete better
by allowing you to adapt … evolve … win.
For more information about this solution
Our Test Floor Operations solution can maximize yield through recovery of devices
wrongly labeled “bad” by up to 5% and can increase efficiency and productivity up
to 20% by optimizing re-test, set-up and correlations, and probe-card/loadboard
management. It can also deliver higher quality and better data integrity through
efficient data logging and data integrity techniques that minimize test escapes.
This solution provides total test floor management, including real-time control
of all ATE, along with fleet control and monitoring. Its monitoring capability includes
comparison of operational performance metrics for all testers running the same product,
which allows you to easily spot yield and tester performance issues.
Test Floor
Operations can also make lot disposition faster and easier and decrease “lots on
hold” by bringing more discipline and more effective processes and methodologies
to the test floor. In addition,
Test Floor Operations helps you reduce operational
costs and increase quality through two of its modules: correlation and golden-units
management and probe-card and load-board management.
As part of OptimalTest’s entire suite of test management solutions, our
Test Floor
Operations solution acts as the execution arm of the adaptive testing and advanced
SPC algorithms (yield, TTR, outliers) through predefined templates that automate
the entire testing process and shorten the learning curve.
Supported by OptimalTest’s robust IT infrastructure, its
Test Floor Operations also
includes:
- Mission critical availability supported by production/engineering
separation
- Data purging for optimal database size, including options for setting
frequency
- Independent station controller, avoiding server/ database dependency
during testing
Additional Features:
- Maximizes yield and efficiency up to 20%
- Data integrity and high quality
- Production mission critical
- Automatic monitoring of process health and quality control
- Enables execution of advanced adaptive testing algorithms (TTR, outlier,
yield, etc
- Includes the Solutions of:
- Fleet Control & Dashboard
- Station Controller
- Analysis & Reporting (Ops)
- Management of:
- Disposition & Correlation
- Probe cards, load boards & sockets
- For wafer sort and final test
- Customizable dashboards with key managerial and operational indicators
- Easy integration and adaptation with existing solutions or other OptimalTest
Solutions
Additional Benefits:
- Maximized yield with higher quality
- Increased efficiency and productivity
- Better data integrity
- Mission-critical support via OptimalTest sophisticated IT infrastructure
- Centralized test management control
- Real-time immediate indicators
- Actionable data for continuous improvement, more effective decision
making