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The unique strength of OptimalTest’s approach is
its blend of traditional test with the new field of
adaptive, or optimal, testing, which greatly
improves the test process and reduces test time.
Adaptive testing uses data in a more systematic
manner (Systemic failures are the primary cause
of failures, according to the International
Technology Roadmap for Semiconductors (ITRS))
so that each device receives its own, tailored
optimal test suite.
OptimalTest’s Test Management Solution adds
value to your test process with its unique ability
to accept data from anywhere in the IC process/
test process chain -- historical or current – for
decision-making using advanced Statistical
Process Control. Centralized, integrated and
completely validated, the Optimal Test approach
gives you more choices in your management of
the test process, no matter what kind of
semiconductor company you are, no matter what
type of device you test, no matter what vector
(Test Time Reduction, Utilization, Yield, Quality,
Reliability) or combination of vectors presents the
greatest challenge for your operation. |
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