OptimalTest provides a rich set of automated, engineering-oriented analysis and
reporting tools that give you actionable data – valuable information – gathered
from the entire test floor: products, equipment and test programs.
Our uniquely designed database, built to address engineering needs, contains information
about test processes as well as typical test results – for example, from parametric
results analysis to probe-card health and maintenance. All data from fab, E-test,
wafer sort and final test are available from a single test repository, giving you
actionable data for better, faster decision making.
Key Features & Benefits:
- Engineering data analysis
- Simulation based on real historical data (TTR, outlier detection,
product dispositioning)
- Automatic health and quality monitoring
- Yield learning
- Direct data log generation for enhanced analysis
- Hundreds of reports for better decision making (managerial, operational,
engineering)
- Accessible locally or remotely
Comprehensive coverage and reporting, which reveals and highlights critical information,
helps your forecasting accuracy and improves your products for better technical
and business decision making so you can adapt … evolve … win.
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Hundreds of pre-defined customizable report templates help you understand complex
test situations and identify opportunities for improving test time, yield and reliability.
This solution can also deliver information from products, equipment and test programs
– the entire test floor – at prearranged intervals for automatic health and quality
monitoring.
Much of the power behind OptimalTest’s Analysis & Reporting solution comes from
its uniquely designed database. Containing information about the test process as
well as about typical test results – for example, rule-set information or probe-card
maintenance – the database was built to address engineering needs. All actionable
data from lithography, defect monitors, E-test, probe and final test are available
from a single repository as inputs to Analysis & Reporting. Also, the unique structure
of the database allows rapid data retrieval and drill-down and zoom-in capabilities
to give you timely, meaningful data for better decision making.
The automatically generated reports deliver data and status for:
- Engineering for wafer sort (e.g., product summary, lot details, die-level
data, failed tests pareto)
- Engineering for final test (e.g., cumulative geographic by test site
bin/parametric map, lot details)
- Performance (e.g., yield by product/test equipment, UPH, probe card
TD summary)
- Cross fleet & cross products (e.g., unit-to-unit comparison by handler)
- Comparison by site for multiple sites
- Retest evaluation for recoverable
- Analysis & simulation (e.g., parametric trend analysis and simulation,
bin switch for wafer sort and final test)
- Management (e.g., utilization and availability, retest rate, yield
by product)
- Operations (e.g., lot runs for wafer sort and final test)
- Test time reduction analysis and simulation
- Outlier detection analysis and simulation
- Customer and business units
Additional Features:
- Engineering data analysis
- Simulation based on real historical data (TTR, Outlier detection,
product Dispositioning)
- Automatic health and quality monitoring for data integrity
- Yield learning
- Smart, direct data log generation for enhanced analysis
- Hundreds of reports for better decision making (managerial, operational,
engineering)
- Accessible locally or remotely
- Rule-Set publishing to real-time or off-line production environment
- Easy integration and adaptation with existing solutions or other OptimalTest
Solutions
Additional Benefits:
- Yield Learning
- Maximized ROI
- High product reliability & quality
- Easy navigation among report families
- Forecasting accuracy
- Scheduled monitoring for continual improvement of rule quality and
efficiency
- Comprehensive coverage and reporting
- Actionable data for continuous improvement, more effective decision
making
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