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OptimalTest’s new generation of Test Management Solutions (TMS) gives you unprecedented improvements in Yield, Test Time Reduction, Reliability, Quality and Productivity based on our:
  • Innovative advanced adaptive testing methodology
  • Patented reference die technology
  • Data Feed Forward/Data Feed Backward capability
  • Centralized, engineering-oriented database designed for rapid data retrieval
  • Unparalleled data integrity and actionable data throughout the IC lifecycle
  • Unique open test-rule generator
  • Open IT infrastructure and seamless connectivity
  • Real-time automation and control
High performance test management at low cost of test allows you to adapt and correct your test processes in real time and continuously improve and evolve products, processes, and operations to compete more effectively.
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OptimalTest to Provide Test Management
Solution to STATS ChipPAC
October, 2008
International Test Conference
Santa Clara, CA USA
October 28 - 30, 2008

Semicon Japan
Makuhari Messe
Chiba, Japan
December 3-5, 2008