Articles and Presentations
Articles and White Papers
A Holistic Approach to use Manufacturing Test Data for the Learning of Yield, Design Issues and Improve Test Process Operational Performances by STMicroelectronics and OptimalTest
Lite Applications Engines Speed Delivery of Advanced Adaptive Test Solutions
by Debbora Ahlgren, Final Test Report, May 2010 (page 9)
Leveraging Test Data as a Strategic Management Tool
by Debbora Ahlgren, Evaluation Engineering, August, 2009
Advanced Adaptive Test for Optimized Semiconductor Operations
OptimalTest White Paper, March 2009
Operational Visibility Is Key
By Dan Glotter, Design & Test Issues, Final Test Report, Feb 2009 (page 11)
"Adaptive Test Delivers More Than TTR"
by John Bearden, Final Test Report, May 2008.
ITC 2013, Craig Nishizaki, Senior Director of ATE Development, NVIDIA
"Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements"
SEMICON West 2013, TestVision 2020 - Dan Glotter, OptimalTest, Escape Prevention & RMA Management
SEMICON Singapore 2013 - Dan Glotter, OptimalTest, Breakthrough in Quality Management
ITC 2012 - Gary Eves, Director of Product Engineering, Broadcom, Broadcom and OptimalTest
ITC 2012 - Dan Glotter, OptimalTest, Keynote Presentation at DATA 2012
SEMICON West 2012 - Dan Glotter, OptimalTest, Optimal Testing: Data Management for Enhanced Quality, Reliability and Yield Improvement
TUG 2011 - Glenn Plowman, Staff Engineer, Qualcomm, Adaptive Testing Techniques at Qualcomm, a Fabless Experience
Verigy Users Conference 2011 - Glenn Plowman, Staff Engineer, Qualcomm, Adaptive Testing Techniques at Qualcomm, a Fabless Experience
ITC 2011 - Octavio Martinez, Qualcomm, OptimalEnterprise at Qualcom
Semicon West 2010, Debbora Ahlgren, OptimalTest - Test Operations Optimization and Adaptive Test Proliferation