Articles and Presentations
Articles and White Papers
A Holistic Approach to use Manufacturing Test Data for the Learning of Yield, Design Issues and Improve Test Process Operational Performances by STMicroelectronics and OptimalTest
Lite Applications Engines Speed Delivery of Advanced Adaptive Test Solutions
by Debbora Ahlgren, Final Test Report, May 2010 (page 9)
Leveraging Test Data as a Strategic Management Tool
by Debbora Ahlgren, Evaluation Engineering, August, 2009
Advanced Adaptive Test for Optimized Semiconductor Operations
OptimalTest White Paper, March 2009
Operational Visibility Is Key
By Dan Glotter, Design & Test Issues, Final Test Report, Feb 2009 (page 11)
"Adaptive Test Delivers More Than TTR"
by John Bearden, Final Test Report, May 2008.
SEMICON Singapore 2013 - Dan Glotter delivered Breakthrough in Quality Management
ITC 2012 - Gary Eves, Director of Product Engineering at Broadcom, delivered Broadcom and OptimalTest at the OptimalTest Corporate Presentation and Luncheon
ITC 2012 - Dan Glotter delivered keynote presentation at DATA 2012
Verigy Users Conference 2011 - Adaptive Testing Techniques at Qualcomm, a Fabless Experience
Qualcomm at ITC 2011 - OptimalEnterprise at Qualcom
Debbora Ahlgren, Semicon West 2010, TechSite, July 14 - Test Operations Optimization and Adaptive Test Proliferation
Lisa Vallerie & Itai BenJacob at TUG 2010 – Advanced Adaptive Test: TTR for the FLEX IGXL Platform
Debbora Ahlgren's presentation from ETS 2009 - Yield, Variability & Reliability in the Nanoera: Will existing approaches survive?
Debbora Ahlgren's presentation from ETS 2009 - Early Detection Solution Improved Profitability Across Global Test Operations