David Park, OptimalTest
Corporate Forum Presentation - Craig Nishizaki, Sr. Director of ATE Development, NVIDIA
- Highlights video: "Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements"
- Full video with Q&A: "Leveraging Cross-Operational Test Data for Manufacturing Yield and DPPM/RMA Improvements"
Corporate Forum Presentation - Michael Schuldenfrei, Chief Technology Officer, OptimalTest
- Full video: "Leveraging Semicondcutor Test Data to Drive Escape Prevention"
- Full video: Escape Prevention Product Demonstration
- Full video: Question and Answer Session
If you would like to read additional material about Adaptive Testing, Test Management, Yield Management and other related topics, here are some suggestions: