Message from Dan
I'm delighted to announce that a
top IDM has signed a multi-year multi-million dollar contract
with OptimalTest which will expand the use of the
OptimalEnterprise solutions within their organization to all
facilities and all testers worldwide. This significantly
strengthens the company's commitment and partnership with
OptimalTest, and underscores the benefits and results they
have experienced. Read more below about why this top IDM made
this strategic decision.
OptimalTest has experienced
unprecidented success and with it significant growth. By the
end of 2013 we will have doubled the number of employees in
this year alone, please read our article below and visit
our website to learn about Phil Wendell, our new VP WW Sales
and welcome other new members of the OT team .
Finally, don't miss our article on the new OT
Escape Prevention Solution, an enhanced approach above and
beyond Outlier Detection.
Feature Article: Top IDM selects
OptimalTest as its Strategic Partner with Multi-year, Multi-million
Dollar Contract Covering over 1500
at OptimalTest in
The executive management
of one of the world's largest IDM semiconductor
companies has signed a multi-year, multi-million dollar
agreement selecting OptimalTest as its strategic partner for
enterprise quality and escape prevention solutions. The
worldwide implementation of the combined solution spans all of
its wafer sort and final test facilities, and over 1500
Following a thorough initial
engagement, this top IDM found that the OptimalTest solutions
exceeded their expectations on all fronts -- delivering strong
ROI and performance along with ease of use, excellent support
and a solid roadmap. With the growing challenges of cost and
quality that the semiconductor industry faces, the
relationship between OptimalTest and the IDM naturally evolved
into a long term partnership which will enable the IDM to
offer its strategic customers unparalleled standards of
quality and reliability. The OptimalEnterprise solutions will
help the IDM to both protect and expand their market share in
strategic segments like Automotive, MEMS and others.
taking an enterprise approach to solving quality issues, this
top IDM will be able to establish common methodologies,
terminology and tools across their entire organization.
Quality metrics and the underlying data will be consistent
across all product groups and factories.
privileged to partner with this top IDM, a leader in the
Automotive and MEMS semiconductor markets. We believe that its
progressive stance on quality and their selection of
OptimalTest will be a tipping point for the rest of the
unprecidented growth and success of the business,
OptimalTest is expanding its presence in the Asia Pacific
region and expanding the OT team worldwide. OptimalTest will
have over 100 employees towards the end of the year, doubling the size
of the team. As part of this growth, we are delighted to
welcome Phil Wendell as the new VP WW Sales. Randy Hierbaum
will continue as VP US Sales.
Phil brings more than 25
years of global sales and marketing experience in the
semiconductor test industry to OptimalTest. Phil joins
OptimalTest from Teradyne, where he most recently served as GM
of U.S. Sales and Service. In this role, Phil led a team of
more than 200 account managers, applications and sales support
employees with worldwide responsibility for all U.S.
headquartered customers including their overseas sites and SCM
suppliers in Asia. Phil's teams have been consistently
recognized as "Best Capital Equipment Supplier" by top 25
worldwide semiconductor companies.
Escape Prevention Solution from OptimalTest!
We are excited to announce a
powerful new set of capabilities, which are being delivered in
our upcoming release, Version 5.2, due out in May 2013.
The new solution was developed in close cooperation
with our customers. It encompasses a number of capabilities
that enable users to help prevent escapes (i.e. bad parts
being shipped to customers), and control and analyze customer
returns (RMSa). Highlights of this release include:
-- Manually or automatically, load information about
bad parts returned by customers. RMA data is then available in
OT-Portal for reporting and analysis.
Automatic Data Retention
Management -- Hold RMA-related data in the
database for longer periods of time.
RMA Analysis Tools -- Trace the
full testing history of each returned part of lot and
determine the cause of the escape.
Wide Range of "Escape Prevention" Rules
-- Monitor incoming data feeds and catch a variety of
quality issues. When triggered, many of these rules can switch
the binning of parts from "good" to "bad" to prevent them
being shipped and alert users to the problem.
Incorporation of Existing OT Outlier
Detection Capabilities -- Dynamic Part Average
Testing (DPAT), NNR, Good Die in Bad Neighborhood and other
PAT Simulation Tool -- Enable PAT
analysis of final test or SLT data.
Unique PAT Validation Capability
-- Match the results of PAT simulations to known RMAs
so you can see if the rule is capable of catching similar
escapes in the future.
Many of the problems
detected by the Escape Prevention solution are hard or
impossible to find without a comprehensive system like the
OptimalEnterprise by OptimalTest, which is monitoring the
supply chain and validating data across process steps and
operations. Examples of Escape Prevention rules
Probe Mark Count Limit --
Catching dice which were probed too many
Good Die with Failing Tests --
Catching parts with passing bins despite the failure of
Passing Test with Out of Limits
Result -- Catching discrepancies between parametric
measurements and the matching pass/fail flag.
Validation -- Ensuring that chip IDs are correctly
written to the chip.
E-Test Disposition --
Finding issues in e-test (a.k.a. WAT or PCM) data and
performing bin switching at wafer sort.
Comparison Between Revs -- Catching issues where a
newly released test program removed critical
Test Program Checksum Validation Across
Runs -- Ensuring that test programs are not
modified once released to production.
All of this is
just the first part of a series of new features we will be
developing to address the issue
of product quality and escape prevention -- stay tuned
at the following industry events, where we will have some
exciting news to share!
OptimalTest will exhibit at
SEMICON West 2013 - Booth
#6584 in the North
Hall by the TechXPOT -- July 9-11, Moscone Convention Center,
San Francisco. Also, plan to attend the OT-Event at the Palomar
on Wednesday July
event page >>
OptimalTest is the Diamond Supporter of ITC 2013 and will exhibit and present at the
conference. Join OptimalTest for a free luncheon and
presentation by Craig
Nishizaki, senior director of test development at
International Test Conference (ITC) 2012 --
Sept. 10-12, Disneyland Hotel, Anaheim, California
visit event page
|In This Issue
- Message from
- Top IDM Signs Deal
- Huge Growth at OT in 2013
- NEW! OT
- Upcoming Events
News + Events
Phil Wendell Joins OT as VP
OT at SEMICON West
in San Francisco at Moscone North Hall
#6584 by the TechXPOT
North. Also plan to join us for the
OT-Event at the
Palomar on Wed. evening
Sept 10-12 at the Disneyland Resort
Hotel, Disneyland, Anaheim, CA. OT is the
2013 where OT will host a luncheon
and presentation by Craig Nishizaki of
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