OT-Post reevaluates all testing results to better control the quality and health of all facets of your testing operations. OT-Post performs cross-quality evaluations of the entire testing fleet and all device test time and yield, offering extreme data-integrity. Furthermore, OT-Post augments product reliability through PAT and other advanced outlier detection techniques.

• Homegrown post-production testing solutions which are often unvalidated, uncontrolled, and in some cases with conflicting scripts.
• Limited post-testing rules, if they exist, cover only basic PAT and health control. And, many post-production operations are undocumented and hard-coded into system equipment - lacking the flexibility and scalability demanded by today's testing standards.
• Need for new tools that add comprehensive data integrity and provide a rich, structured rule-set language.

Through execution of advanced off-line rule sets, OT-Post reevaluates testing results and then dispositions them accordingly. OT-Post improves device reliability using a rich array of reliability rules, and delivers the highest testing quality through cross-SPC health control comparison of devices, test-fleet and test processes. The end result – enhanced visibility for testing results and fleet health, and insight into the entire testing process.

OT-Post enhances device reliability through a rich array of reliability augmentation rules, including PAT, advanced outlier detection, and other sophisticated reliability algorithms. These can be validated to catch reliability fallout at the current socket rather than the next socket, decreasing next socket capacity demands like burn-in capacity, and increasing overall product reliability.

OT-Post helps better categorize and cherry-pick your devices for the right marketing niches or create the right combination of devices within a Multi-Chip-Package (MCP) device for targeted markets.

OT-Post offers improved health control through rich and unique SPC comparison of:

• Processes
  OT-Post detects non-optimized processes through lithography, defects, e-test parameters and other unique SPC criteria for highest yields and best process operation windows.
• Devices
  OT-Post detects non-optimized device testing processes and related characteristics, helping align all devices to a baseline, and controlling yield, retest/resort rates, and real-time rules.
• Test Fleet
  OT-Post detects outlier test equipment through rich SPC rules, seeking out equipment outliers, trends, marginalities and freezes – and baselining your fleet at highest standards.
• Test Process
  OT-Post detects critical parameters like correlation/standards pass rate, run rate and performance. OT-Post also detects die gain and binswitching control resulting from retest/resort – across all SPC rule types for best process optimization.