OptimalTest’s Global Operations is the industry’s first comprehensive solution that provides a single integrated view of your global test operations and processes, vertically within your organization or dispersed among your subcontractors, whether local, regional, or worldwide.
Already installed and in use at the leading Fabless semiconductor organizations globally, this solution facilitates more effective supply chain collaboration, and provides visibility and timely actionable data, for improved decision-making and better overall results.
The Global Operations solution provides the foundation enabling the Global Semiconductor Information Highway. By joining the leaders in the industry already "on the highway", Fabless and IDM organizations will benefit from our established and fast-growing infrastructure. This allows you to get started quickly and easily. Whatever your business type, you will be able to see immediate and measurable results, such as increases in yield and quality, giving you a strong competitive edge.
The Global Operations Solution is part of the OptimalEnterprise™ Solution Suite, and is designed for global Fabless organizations and business units within IDMs that outsource wafer probe, assembly and final test operations. You can implement this powerful and flexible solution in phases and with a variety of options.
OptimalTest installs OT-Proxy at your subcontractors or your test operation for real-time test data acquisition. This data is sent to your local or regional operations for near-time delivery of early notifications about quality, yield loss, throughput and data integrity. Offline transfer of data logs from your regional operations to headquarters provides additional early notifications as well as offline analysis and reporting. The data arrives and is available within minutes, so you can take immediate action. Important in all phases of business, this is essential in new product introductions for next-generation products.
The OptimalTest tools provide you access from numerous test processes, including:
- E-Test (sometimes known as WAT or PCM)
- Wafer Sort
- Final Test
Global Operations Modules
The Global Operations solution consists of the following modules: